Visible Spectral Reflectance Analysis in a Metal-Insulator-Metal (MIM) Multilayer with COMSOL MultiphysicsY. Oshikane, K. Murai
Osaka University, Suita City, Osaka, Japan
We are developing a reflective metal-insulator-metal (MIM) filter with narrow band absorption. In the MIM structure, the interaction between subwavelength multilayer and visible light, and the resultant surface plasmon resonance (SPR) in specific illumination conditions must be understood. Such electromagnetic field interactions have been analysed using COMSOL Multiphysics and RF Module.